Lasertec Corporation

Lasertec Corporation designs, manufactures, and sells inspection and measurement equipment. The company's operations span Japan, South Korea, Taiwan, Other Asia, and the United States. Its primary offerings include semiconductor-related products such as the Actinic EUV patterned mask inspection system, EUV mask blanks inspection and review system, mask inspection system, mask blanks inspection and review system, EUV pellicle inspection system, EUV mask backside inspection and cleaning system, and mask edge inspection system. Lasertec also provides phase-shift and transmittance measurement systems, phase-shift measurement systems, and various wafer inspection and measurement systems including SiC wafer inspection and review system, GaN wafer inspection and review system, high sensitivity under-layer defect inspection and review system, multi-wavelength wafer inspection system, high sensitivity wafer edge inspection system, wafer edge-dimension measurement system, via depth measurement system, TSV back grinding process measurement system, and fully automated wafer measurement system. Additionally, the company offers FPD photomask inspection systems, pellicle inspection and pellicle mounting systems for CLIOS, and FPD mask blanks inspection systems. Its product portfolio also includes microscopes, specifically laser microscopes, electro-chemical reaction visualizing confocal systems, and in-situ observation at ultra high temperature confocal scanning laser microscopes. Lasertec Corporation was founded in 1960 as NJS Corporation and adopted its current name in 1986. The company is headquartered in Yokohama, Japan.